The identification of unknown values, so called X-values, is strictly required for an effective test strategy for the production test of today's digital circuits. X-values which will not be masked out are able to mask faulty values during test application. By this, an erroneous behavior may not be detected and a faulty chip might pass the test. In this project, automated methods will be developed which are able to identify the sources of X-values early in the design flow.
|Duration:||Dec 1, 2013 - May 31, 2015|
|Research area:||Hardware Systems|